Workshop on Radiation Effects on Optoelectronics and Photonics Technologies
Saint-Etienne (France)

Program

Monday, November 15, 2021
14:00
15:00
16:00
17:00
18:00
›14:00 (15min)
›14:15 (1h15)
Tutorial on Integrated Photonics and its potential in harsh environments - Dr. Thijs van Leest
The ability of integrating optical functionalities as light generation, manipulation and detection onto a chip in building blocks, i.e. integrated photonics, allows the realization of a wide variety of optical circuits on a generic manufacturing platforms similar to that of electronic ICs. Enabling small footprint solutions is very attractive for applications in harsh environments. In this presentation examples and approaches are discussed towards the realization of these applications and whether a generic approach, as applied to photonic building blocks, could be extended to advance realization of integrated photonic solutions in harsh environment.
›15:30 (1h15)
Tutorial on Radiation Effects in CMOS Image Sensors: an Overview - Pr. Vincent Goiffon
Nowadays, CMOS Image Sensors (CIS), also called Active Pixel Sensors (APS), represent the most popular solid-state imager technology as illustrated by its ubiquity in mass consumer smartphones and cameras. In particular, CISs are used in various imaging applications in harsh radiation environments (e.g. space remote sensing, nuclear and scientific instrumentation and medical imaging). During this lecture, the particularities of the CIS technology will be briefly presented. In a second part, an overview of the most important radiation effects on these imagers will be discussed. In particular, the physical mechanisms at the origin of the most important Total Ionizing Dose (TID) and Displacement Damage (DD) effects in CISs will be detailed including: charge transfer degradation, dark current increase, hot pixel creation, and random telegraph signals (RTS).
›16:45 (30min)
›17:15 (1h15)
Tutorial on Radiation effects on optical fibers and optical fiber sensors - Dr. Adriana Morana
Optical fibers (OFs) and Optical Fiber Sensors (OFSs) are more considered for implementation in harsh environments, combining extreme temperatures and radiations, from space applications to nuclear power plants. Even if such technologies present much higher radiation tolerance levels than most of micro- or opto-electronic counterparts, ionizing and non ionizing radiations could induce defect generation and/or structural changes, by degrading the OF and OFS performances. For particular cases, such degradation can even be used for radiation detection. In this tutorial, we will overview the main induced radiation effects on OFs, the working principles and the radiation effects of the most common OFSs.
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